We are looking for an experienced DFT Engineer with strong hands-on expertise in Design for Testability (DFT) for complex ASIC and SoC designs. The role focuses on developing and implementing DFT architectures, scan insertion, scan-chain implementation, MBIST, ATPG, test-pattern generation, and DFT verification.
The ideal candidate will have a strong understanding of semiconductor test methodologies and the ability to own DFT activities across the design lifecycle, from architecture and implementation through pattern generation, verification, coverage analysis, and sign-off.
KEY RESPONSIBILITIES
Develop and implement DFT architectures for complex ASIC and SoC designs.
Define and implement scan architecture, scan insertion, and scan-chain structures.
Develop, debug, and validate ATPG patterns for stuck-at, transition, and other fault models.
Implement and verify MBIST solutions for embedded memories.
Analyse and improve test coverage, fault simulation results, and pattern quality.
Perform DFT rule checks and identify and resolve DFT-related design violations.
Integrate DFT logic into RTL and netlist flows while ensuring compatibility with synthesis and physical implementation.
Debug scan-chain, ATPG, MBIST, test-coverage, and pattern-simulation issues.
Support scan-chain diagnosis and DFT-related design debugging.
Collaborate with RTL, Design Verification, Physical Design, STA, and Silicon Validation teams.
Support DFT verification, ATPG pattern simulation, and silicon bring-up activities.
Review DFT requirements and contribute to overall test strategy and methodology development.
Analyse fault coverage and identify opportunities to improve test quality and efficiency.
Support DFT implementation through synthesis, physical design, timing, and sign-off stages.
Prepare and maintain DFT documentation covering architecture, implementation, coverage, debug results, and sign-off.
Contribute to DFT methodology improvements, automation, and best practices across projects.
WHAT MAKES YOU A GREAT FIT
7+ years of hands-on experience in DFT / Design for Testability for ASIC, SoC, or semiconductor products.
Strong practical expertise in MBIST, ATPG, Scan Insertion, and Scan Architecture.
Proven experience with scan-chain design, implementation, debugging, and validation.
Strong understanding of ATPG fault models, including stuck-at and transition faults.
Experience analysing test coverage, fault simulation, and ATPG pattern quality.
Strong knowledge of DFT rule checking and resolving DFT-related violations.
Hands-on experience with MBIST implementation and verification for embedded memories.
Strong understanding of DFT verification, pattern simulation, and test-pattern debugging.
Good knowledge of ASIC/SoC DFT methodologies and semiconductor test flows.
Understanding of the RTL-to-GDSII flow and DFT interaction with synthesis, STA, and physical design.
Experience working with industry-standard DFT and ATPG tools is highly desirable.
Strong debugging, analytical, and problem-solving skills.
Ability to work effectively with cross-functional semiconductor engineering teams.
Strong communication and documentation skills with the ability to clearly explain DFT issues and implementation decisions.
Ability to take ownership of DFT activities from architecture and implementation through coverage, verification, and sign-off.
Bachelors or Masters degree in Electrical Engineering, Electronics & Communication, VLSI, Microelectronics, or a related discipline is preferred.
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